Author(s):

Anoop Soni, VS Kandalkar, Munesh Kumar Kushwah and Vijay Kumar Gupta

Abstract: Inheritance analysis was carried out for grain yield and agronomic attributing traits in wheat. A set of 21 F₁s generated by crossing in Line X Tester mating design using 7 lines of bread wheat viz., C 306, DL 803-3, GW190, GW322, PBW 175, MACS 6222 and HI 1544 and 3 testers HD 2932, GW173 and PBW 343. A field experiments was conducted in randomized complete block design with 4 replications. Analysis of variance revealed that both additive as well as non-additive variances were prevalent for the control of grain yield, grain weight, flag-leaf area, biological yield per plant and harvest index. Additive variances controlled days to heading, days to flowering, days to maturity, grain filling period, plant height and spike length, whereas, non-additive variances controlled tillers per plant. ‘MACS 6222’ and ‘HI 1544’ were identified as good general combining parents for grain yield per plant and yield component traits. Good specific combiners were cross GW 190 X HD 2932, MACS 6222 X PBW 343, PBW 175 X GW 173, C 306 X PBW 343, DL 803-3 X GW 173, HI 1544 X GW 173 and HI 1544 X HD 2932 for grain yield per plant and various components traits. Five crosses viz., MACS 6222 X PBW 343, HI 1544 X HD 2932, HI 1544 X GW 173, DL 803-3 X PBW 343 and GW 322 X HD 2932 showed significant heterosis over mid parent as well as better parent for grain yield. Cross combination viz., MACS 6222 X PBW 343, HI 1544 X HD 2932 and HI 1544 X GW 173 may be advanced to improve grain yield as these crosses showed high mean performance with good specific combiners involving good general combining parents and also showed significant high positive heterosis over mid-parent and better parent for grain yield per plant.

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